02-328-7475-6 , 02-328-7618-9
โพสเมื่อ
ชื่อสินค้า
เครื่องวิเคราะห์ขนาดอนุภาคระดับนาโน 0.3 - 10,000 nm
เวลาการจัดส่ง
60-90 daysDay(s)
การขนส่ง
บริษัทนำส่งพร้อมติดตั้งและสาธิตการใช้งาน
รายละเอียด:
Nanotrac Wave Features:
- Dynamic Light Scattering incorporating the patented Controlled Reference Method for advanced power spectrum analysis of Doppler shifts under Brownian Motion
- Able to measure up to 40% concentration
- No “A Priori” or advance knowledge of the particle size distribution is required
- Typically less than 750µl in zeta cell, or as low as 250µl with size only cell option
- Measurement capability from 0.8 to 6500 nanometers. Zeta Potential from -200 to +200mV
- Peltier temperature control device
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Nanotrac Wave Benefits:
- While other DLS instruments utilize PCS to measure particle size, Microtrac’s Controlled Reference Method incorporates heterodyne detection by calculating signals of various scattered light frequencies combined with the reflected signal of the un-shifted frequency of the original laser, to generate a wide spectrum of frequencies. The power spectrum is then deconvolved which provides higher accuracy for multi modal and broad distribution measurements
- The Wave measures all three parameters in a single sample cell, and single optical path – no requirement to purchase separate cuvettes for different measurements. Measurements can be made with a single sample aliquot without the requirement to change concentration.
- With the ability to measure up to 40% concentration, the need to dilute highly concentrated samples is greatly reduced.
- Short optical path allows users to measure higher concentrations of a substance
- Lasers measure at 780 nm which cause low levels of fluorescence and improves the accuracy of the measurement
- With the ability to adjust the temperature of your material, a user can directly see how various changes affect the particle size and zeta potential measurement.
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คำค้นหา:
size analyzer เครื่องวิเคราะห์ขนาดอนุภาค particle