PORTASPEC 2501 XLE
BENCHTOP ELEMENTS X-RAY SPECTROGRAPH
The portaspec is designed to fill a need for an instrument technique that could rapidly and non-destructively analyze light elements in a central laboratory or in the plant using wavelength dispersive x-ray fluorescence. It has the ability analyze powder and solids with its inclued single position sample holder. It has a single element option for Cr, Ti, Zn, Al, Si, P, S, Cl, K, Ca, or Zr and can measure Zirconium or Phosphorus pretreatment
It is operated by a PC Touchscreen Notebook Computer, complete with Windows based preinstalled Software
-> Application for Ti,Cr, Zr,Zn and others, coating weight , thin films, as well as coating thickness analysis for sheet metal steel, metallic coating.